PIDStudio PID操作软件
- 公司名称 束蕴仪器（上海）有限公司
- 品牌 Freiberg Instruments
- 型号 PIDStudio
- 产地 德国
- 厂商性质 代理商
- 更新时间 2025/4/24 8:12:32
- 访问次数 1551
联系方式：朱17621138977 查看联系方式
联系我们时请说明是化工仪器网上看到的信息，谢谢!
| 价格区间 | 面议 | 应用领域 | 医疗卫生,环保,食品/农产品,化工,能源 |
|---|
PID操作软件PIDStudio是一个很*的软件，它非常容易操作和直观，因为它根据我们用户的反馈持续更新和改进。
通过PIDStudio，可以输出和比较多个测量的下列参数：
● 并联电阻
● 电导率
● 功率损耗
● 泄漏电流
● 温度
● 湿度
● 高电压
PID操作软件主要特点：
● 用户结构
● 输出功能
● 谱图
● 通过和失败标准
● 分析功能包
● 可控制任意数量的设备
参考文献： cells (1)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Local corrosion of silicon as root cause for potential induced degradation at the rear side of bifacial PERC solar cells. physica status solidi (RRL)–Rapid Research Letters. 2019, doi 10.1002/pssr.201900163
(2)V. Naumann, K. Ilse, M. Pander, J. Tröndle, K. Sporleder, C. Hagendorf, Influence of soiling and moisture ingress on long term PID susceptibility of photovoltaic
modules, AIP Conference Proceedings 2147, 090005 (2019).
(3)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Root cause analysis on corrosive potential-induced degradation effects at the rear side of bifacial silicon PERC solar cells, Solar Energy Materials and Solar Cells 201, 110062 (2019).
(4)K. Sporleder, V. Naumann, J. Bauer, S. Richter, A. Hähnel, S. Großer, M. Turek, C. Hagendorf, Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells
as Root Cause of Potential‐Induced Degradation at the Rear Side, Phys. Status Solidi A (2019), doi:10.1002/pssa.201900334.
(5)K. Sporleder, J. Bauer, S. Großer, S. Richter, A. Hähnel, M. Turek, V. Naumann, K. Ilse, C. Hagendorf, Potential-Induced Degradation of Bifacial PERC Solar Cells Under Illumination, IEEE Journal of Photovoltaics 9 (6) 1522-1525, 2019.
(6)K. Sporleder, M. Turek, N. Schüler, V. Naumann, D. Hevisov, C. Pöblau, S. Großer, H. Schulte-Huxel, J. Bauer, C. Hagendorf, Quick test for reversible and irreversible PID of bifacial PERC solar cells, Solar Energy Materials and Solar Cells 219, 110755, 2021.
(7)K. Sporleder, V. Naumann, J. Bauer, D. Hevisov, M. Turek, and C. Hagendorf, Time-resolved Investigation of Transient Field Effect Passivation States during Potential Induced Degradation and Recovery of Bifacial Silicon Solar Cells , Solar RRL, 2021, accepted.
采购中心
化工仪器网