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目录:赛默飞电子显微镜>>透射电子显微镜(TEM)>> 200KV透射电镜Spectra 200 TEM

200KV透射电镜Spectra 200 TEM
  • 200KV透射电镜Spectra 200 TEM
参考价 面议
具体成交价以合同协议为准
参考价 面议
具体成交价以合同协议为准
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  • 厂商性质 生产商
  • 所在地 上海市
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更新时间:2024-08-28 13:41:37浏览次数:928评价

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200KV透射电镜Spectra 200 TEM
使用无边缘效应成像 (FFI) 可在每个样品区采集更多的图像,从而提高了图片采集的日产出。 听听 FFI 如何帮助 Elizabeth Villa 博士实验室的日常研究。

200KV透射电镜Spectra 200 TEM

200KV透射电镜Spectra 200 TEM High throughput TEM and STEM microscope for all materials science applications

Key Features


 Powered by the ultra-high-brightness cold field emission gun (X-CFEG)
 High-resolution STEM imaging performance for all accelerating voltages

High-angle annular dark-field (HAADF) images of GaN and silicon.

 Unprecedented sensitivity with the Panther STEM detection system
 Advanced STEM imaging capabilities


Electron microscope pixel array detector (EMPAD) image of MoS2.


 New possibilities in STEM analytics with Spectra 200 S/TEM

Specifications

Spectra 200 (S)TEM
  • Probe corrector:

    • Energy spread: 0.4 eV

    • Information limit: 110 pm

    • STEM resolution: 60 pm (136 pm @ 30 kV)

  • Uncorrected:

    • Energy spread: 0.4 eV

    • Information limit: 110 pm

    • STEM resolution: 164 pm

Source
  • X-CFEG: Ultra-high-brightness cold field emission gun with energy resolution of <0.4 eV

  • Flexible high-tension range from 30 – 200 kV

Analytics and detectors
  • Super-X/Dual-X EDS options, integrated software, and the Gatan Ultrafast EELS/DualEELS options together provide up to 1000 sp/s of simultaneous EDS and EELS data acquisition

  • Analytics for live peak identification and background fitting during ultra-fast EDS acquisition

  • Symmetric EDS detector design allows for combined tomographic EDS

Available detector options
  • HAADF detector

  • On-axis solid state, 8 segmented BF and ADF detectors (16 segments in total)

  • Thermo Scientific Ceta 16M Camera (optionally with speed enhancement)

  • Gatan OneView/OneView IS cameras

  • Gatan energy filter series

  • Electron microscope pixel array detector (EMPAD)



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